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J. Semicond. > 2008, Volume 29?>?Issue 8?> 1566-1569

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Transient Characteristic Analysis of a Double-Gate Dual-Strained-Channel SOI CMOS

Sun Liwei, Gao Yong, Yang Yuan and Liu Jing

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Abstract: Transient characteristic analysis of a CMOS circuit based on a double-gate dual-strained channel SOI MOSFET with the effective gate length scaling down to 25nm is presented.As a result of simulations,by the adoption of a single-gate (SG) control mechanism,the conversion time from logic 1 to logic 0 is shorter for conventional strained-Si CMOS than unstrained CMOS.Furthermore,the conversion time from logic 0 to logic 1 can be reduced by the application of a strained-SiGe CMOS circuit.However,the CMOS circuit based on the novel structure can reduce tHL and tLH simultaneously.By the adoption of a double-gate (DG) control mechanism,the conversion time of the CMOS circuit shows a dramatic reduction compared with the SG control mechanism and the performance of the CMOS circuit can be improved significantly.

Key words: double-gatedual-strained-channelCMOS

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    Received: 18 August 2015 Revised: 13 March 2008 Online: Published: 01 August 2008

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      Sun Liwei, Gao Yong, Yang Yuan, Liu Jing. Transient Characteristic Analysis of a Double-Gate Dual-Strained-Channel SOI CMOS[J]. Journal of Semiconductors, 2008, 29(8): 1566-1569. ****Sun L W, Gao Y, Yang Y, Liu J. Transient Characteristic Analysis of a Double-Gate Dual-Strained-Channel SOI CMOS[J]. J. Semicond., 2008, 29(8): 1566.
      Citation:
      Sun Liwei, Gao Yong, Yang Yuan, Liu Jing. Transient Characteristic Analysis of a Double-Gate Dual-Strained-Channel SOI CMOS[J]. Journal of Semiconductors, 2008, 29(8): 1566-1569. ****
      Sun L W, Gao Y, Yang Y, Liu J. Transient Characteristic Analysis of a Double-Gate Dual-Strained-Channel SOI CMOS[J]. J. Semicond., 2008, 29(8): 1566.

      Transient Characteristic Analysis of a Double-Gate Dual-Strained-Channel SOI CMOS

      • Received Date: 2015-08-18
      • Accepted Date: 2008-02-21
      • Revised Date: 2008-03-13
      • Published Date: 2008-08-02

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