PAPERS
Sun Hao, Qi Ming, Xu Anhuai, Ai Likun and Zhu Fuying
Abstract: Heavily carbon doped p-type GaAsSb epi-layers with lattice matched to InP substrate are grown by gas source molecular beam epitaxy (GSMBE) using carbon tetrabromide (CBr4) as the carbon source.The doping characteristics of carbon-doped GaAsSb with a hole concentration of (1~20)e19cm-3 are investigated.A maximal hole concentration of 2.025e20cm-3 is obtained with a corresponding mobility of 20.4cm2/(V·s).The effects of growth temperature on the epi-layer composition,crystalline quality,and surface roughness are also studied experimentally,and it is found that 480℃ is the optimal growth temperature at which high quality carbon-doped p-type GaAsSb epi-layers can be obtained.
Key words: heterojunction bipolar transistor, InP, GaAsSb, carbon doping, gas source molecular beam epitaxy
Article views: 3397 Times PDF downloads: 2317 Times Cited by: 0 Times
Received: 18 August 2015 Revised: 17 May 2007 Online: Published: 01 November 2007
| Citation: |
Sun Hao, Qi Ming, Xu Anhuai, Ai Likun, Zhu Fuying. Heavily Carbon-Doped p-Type GaAsSb Grown by Gas Source Molecular Beam Epitaxy[J]. Journal of Semiconductors, 2007, 28(11): 1765-1768.
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Sun H, Qi M, Xu A H, Ai L K, Zhu F Y. Heavily Carbon-Doped p-Type GaAsSb Grown by Gas Source Molecular Beam Epitaxy[J]. Chin. J. Semicond., 2007, 28(11): 1765.
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