Chin. J. Semicond. > 1994, Volume 15?>?Issue 11?> 774-781

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    Received: 19 August 2015 Revised: Online: Published: 01 November 1994

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      江劍平，李艷和，武建平，許知止. 用激光探針測量半導體器件中的載流子濃度調制效應[J]. 半導體學報(英文版), 1994, 15(11): 774-781.
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      江劍平，李艷和，武建平，許知止. 用激光探針測量半導體器件中的載流子濃度調制效應[J]. 半導體學報(英文版), 1994, 15(11): 774-781.

      • Received Date: 2015-08-19

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