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J. Semicond. > 2008, Volume 29?>?Issue 5?> 950-953

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A New Method for Measuring Series Resistance of RTDs

Guo Weilian, Song Ruiliang, Wang Wei, Yu Xin, Niu Pingjuan, Mao Luhong, Zhang Shilin and Liang Huilai

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Abstract: According to the relation among peak voltage Vp,series resistance RS,and external resistance Rex,a novel method for measuring the series resistance RS of RTDs is proposed.The experimental result demonstrates that this method is accurate,simple,convenient,and quick.The derivation of the relation among Vp,RS,and Rex,the principle of RS measurement,the measured result of RS,and a comparison between this method and other measurement methods are illustrated in detail.

Key words: parameters of RTDmeasurement method of series resistancethe expression of RTD performance

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    Received: 18 August 2015 Revised: 03 December 2007 Online: Published: 01 May 2008

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      Guo Weilian, Song Ruiliang, Wang Wei, Yu Xin, Niu Pingjuan, Mao Luhong, Zhang Shilin, Liang Huilai. A New Method for Measuring Series Resistance of RTDs[J]. Journal of Semiconductors, 2008, 29(5): 950-953. ****Guo W L, Song R L, Wang W, Yu X, Niu P J, Mao L H, Zhang S L, Liang H L. A New Method for Measuring Series Resistance of RTDs[J]. J. Semicond., 2008, 29(5): 950.
      Citation:
      Guo Weilian, Song Ruiliang, Wang Wei, Yu Xin, Niu Pingjuan, Mao Luhong, Zhang Shilin, Liang Huilai. A New Method for Measuring Series Resistance of RTDs[J]. Journal of Semiconductors, 2008, 29(5): 950-953. ****
      Guo W L, Song R L, Wang W, Yu X, Niu P J, Mao L H, Zhang S L, Liang H L. A New Method for Measuring Series Resistance of RTDs[J]. J. Semicond., 2008, 29(5): 950.

      A New Method for Measuring Series Resistance of RTDs

      • Received Date: 2015-08-18
      • Accepted Date: 2007-09-29
      • Revised Date: 2007-12-03
      • Published Date: 2008-05-05

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