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J. Semicond. > 2008, Volume 29?>?Issue 9?> 1794-1798

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Effect of Thickness on the Rectifying Properties of La0.85Sr0.15MnO3/TiO2 Heterostructures

Li Tong, Pei Zhijun, Sun Shoumei, Ma Xingbing, Feng Liying, Zhang Ming and Yan Hui

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Abstract: La0.85Sr0.15MnO3 (LSMO)/TiO2 heterostructures are synthesized by RF magnetron sputtering with different LSMO thicknesses.The rectifying properties of the junctions are related to the LSMO thickness and good rectifying properties appear in the LSMO(100nm)/TiO2 junction.Furthermore,an excellent rectifying characteristic is presented over a relatively wide temperature range for LSMO(100nm)/TiO2 heterostructures.All samples exhibit a huge effective resistance,which plays an important role in the I-V curves as well as the rectifying properties.The diffusion potential of the heterostructures decreases as the measurement temperature increases,which is attributed to the modulation of the interface electronic structure of LSMO/TiO2 heterostructures.The metal-insulator (M-I) transition of LSMO also appears in the heterostructures and the increased sheet-resistance of heterostructures at low temperature is related to the introduction of effective resistance.

Key words: heterostructure, rectifying, CMR

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    Received: 18 August 2015 Revised: 23 April 2008 Online: Published: 01 September 2008

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      Li Tong, Pei Zhijun, Sun Shoumei, Ma Xingbing, Feng Liying, Zhang Ming, Yan Hui. Effect of Thickness on the Rectifying Properties of La0.85Sr0.15MnO3/TiO2 Heterostructures[J]. Journal of Semiconductors, 2008, 29(9): 1794-1798. ****Li T, Pei Z J, Sun S M, Ma X B, Feng L Y, Zhang M, Yan H. Effect of Thickness on the Rectifying Properties of La0.85Sr0.15MnO3/TiO2 Heterostructures[J]. J. Semicond., 2008, 29(9): 1794.
      Citation:
      Li Tong, Pei Zhijun, Sun Shoumei, Ma Xingbing, Feng Liying, Zhang Ming, Yan Hui. Effect of Thickness on the Rectifying Properties of La0.85Sr0.15MnO3/TiO2 Heterostructures[J]. Journal of Semiconductors, 2008, 29(9): 1794-1798. ****
      Li T, Pei Z J, Sun S M, Ma X B, Feng L Y, Zhang M, Yan H. Effect of Thickness on the Rectifying Properties of La0.85Sr0.15MnO3/TiO2 Heterostructures[J]. J. Semicond., 2008, 29(9): 1794.

      Effect of Thickness on the Rectifying Properties of La0.85Sr0.15MnO3/TiO2 Heterostructures

      • Department of Electronics Engineering,Tianjin University of Technology and Education,Tianjin 300222,China

      • Laboratory of Thin Film Materials,Beijing University of Technology,Beijing 100022,China

      • Department of Electronics Engineering,Tianjin University of Technology and Education,Tianjin 300222,China

      • Department of Electronics Engineering,Tianjin University of Technology and Education,Tianjin 300222,China

      • Department of Electronics Engineering,Tianjin University of Technology and Education,Tianjin 300222,China

      • Department of Electronics Engineering,Tianjin University of Technology and Education,Tianjin 300222,China

      • Laboratory of Thin Film Materials,Beijing University of Technology,Beijing 100022,China

      • Laboratory of Thin Film Materials,Beijing University of Technology,Beijing 100022,China

      • Received Date: 2015-08-18
      • Accepted Date: 2008-03-06
      • Revised Date: 2008-04-23
      • Published Date: 2008-09-03

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