Abstract: Aiming at the problem of testing parametric fault in analog integrated circuits,an approach based on power spectrum correlation analysis for diagnosing parametric faults is presented.After wavelet filter-banks’ filtering,the coherence function of the sub-band response sequence is computed.Subsequently,correlation analysis is imposed upon the power spectrum described by the coherence function sequence.As a result,not only can extracting the digital signature of the parametric fault be completed,but also the location of the parametric fault can be found.By virtue of international benchmark circuits,state variable filter,and leapfrog filter,the effectiveness of this approach with respect to locating parametric faults is validated by comparison with that in Ref.［8］.This provides a novel way to realize high fault coverage and automation of diagnosing parametric faults in analog integrated circuits.

Key words: testing of analog integrated circuits, fault diagnosis, parametric faults, fault location, coherence function