LETTERS
Gao Qun, Zhang Jingwen and Hou Xun
Abstract: Etching process of back-illuminated ZnO ultraviolet focal plane array imagers was investigated.The etching result of 128×128 array,in which the area of unit cell was 25μm×25μm,was studied.The profile angle was approximately 80°. There was a linear relationship between the etching depth and the etching time.The dependence of etching rate on NH4Cl solution concentration was also studied.The photoresponsivity of the array's unit cells was measured.The UV-to-visible rejection ratio was around 60∶1.
Key words: etching, NH4Cl, focal plane array
Article views: 3533 Times PDF downloads: 1284 Times Cited by: 0 Times
Received: 18 August 2015 Revised: 08 July 2008 Online: Published: 01 December 2008
| Citation: |
Gao Qun, Zhang Jingwen, Hou Xun. Etching Process of Back-Illuminated ZnO Ultraviolet Focal Plane Array Imagers[J]. Journal of Semiconductors, 2008, 29(12): 2304-2306.
****
Gao Q, Zhang J W, Hou X. Etching Process of Back-Illuminated ZnO Ultraviolet Focal Plane Array Imagers[J]. J. Semicond., 2008, 29(12): 2304.
|
Journal of Semiconductors © 2017 All Rights Reserved 京ICP備05085259號-2