PAPERS
Song Jianjun, Zhang Heming, Dai Xianying, Hu Huiyong and Xuan Rongxi
Abstract: A band edge model in (101)-biaxial strained Si on relaxed Si1-xGex alloy,or monoclinic Si (m-Si),is presented using the k·p perturbation method coupled with deformation potential theory.Results show that the [001],[001],[100],[100] valleys constitute the conduction band (CB) edge,which moves up in electron energy as the Ge fraction (x) increases.Furthermore,the CB splitting energy is in direct proportion to x and all the valence band (VB) edges move up in electron energy as x increases.In addition,the decrease in the indirect bandgap and the increase in the VB edge splitting energy as x increases are found.The quantitative data from the models supply valuable references for the design of the devices.
Key words: strained Si, band edge, k·pmethod
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Received: 18 August 2015 Revised: 05 May 2008 Online: Published: 01 September 2008
| Citation: |
Song Jianjun, Zhang Heming, Dai Xianying, Hu Huiyong, Xuan Rongxi. Band Edge Model of (101)-Biaxial Strained Si[J]. Journal of Semiconductors, 2008, 29(9): 1670-1673.
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Song J J, Zhang H M, Dai X Y, Hu H Y, Xuan R X. Band Edge Model of (101)-Biaxial Strained Si[J]. J. Semicond., 2008, 29(9): 1670.
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