Chin. J. Semicond. > 2007, Volume 28?>?Issue 6?> 980-983

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Real-Time and On-Line Measurement of Junction Temperature for Semiconductor Power Devices

Zhu Yangjun, Miao Qinghai, Zhang Xinghua, Yang Lieyong and Lu Shuojin

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Abstract: A new method for the real-time measurement of junction temperature is introduced.For transistors dissipating power at a constant rate,the heating current is treated as the measuring current in order to measure directly the junction temperature of the transistors.The method can be used in on-line measurements.

Key words: real-time measurement, junction temperature, background data

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    Received: 18 August 2015 Revised: 03 February 2007 Online: Published: 01 June 2007

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      Zhu Yangjun, Miao Qinghai, Zhang Xinghua, Yang Lieyong, Lu Shuojin. Real-Time and On-Line Measurement of Junction Temperature for Semiconductor Power Devices[J]. Journal of Semiconductors, 2007, 28(6): 980-983. ****Zhu Y J, Miao Q H, Zhang X H, Yang L Y, Lu S J. Real-Time and On-Line Measurement of Junction Temperature for Semiconductor Power Devices[J]. Chin. J. Semicond., 2007, 28(6): 980.
      Citation:
      Zhu Yangjun, Miao Qinghai, Zhang Xinghua, Yang Lieyong, Lu Shuojin. Real-Time and On-Line Measurement of Junction Temperature for Semiconductor Power Devices[J]. Journal of Semiconductors, 2007, 28(6): 980-983. ****
      Zhu Y J, Miao Q H, Zhang X H, Yang L Y, Lu S J. Real-Time and On-Line Measurement of Junction Temperature for Semiconductor Power Devices[J]. Chin. J. Semicond., 2007, 28(6): 980.

      Real-Time and On-Line Measurement of Junction Temperature for Semiconductor Power Devices

      • School of Physics and Microelectronics,Shandong University, Jinan 250100,China

      • School of Computer Engineering,Nanyang Technological University, Singapore 639798,Singapore

      • School of Physics and Microelectronics,Shandong University, Jinan 250100,China

      • School of Physics and Microelectronics,Shandong University, Jinan 250100,China

      • School of Physics and Microelectronics,Shandong University, Jinan 250100,China

      • Received Date: 2015-08-18
      • Accepted Date: 2006-12-13
      • Revised Date: 2007-02-03
      • Published Date: 2007-05-30

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