Chin. J. Semicond. > 1995, Volume 16?>?Issue 3?> 170-176

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    Received: 19 August 2015 Revised: Online: Published: 01 March 1995

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      王小軍，莊巖，王玉田，莊婉如，王啟明，黃美純. 高精度雙晶衍射（HRDCD）方法檢測InGaAs／GaAs超薄應變層量子阱結構參數[J]. 半導體學報(英文版), 1995, 16(3): 170-176.
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      王小軍，莊巖，王玉田，莊婉如，王啟明，黃美純. 高精度雙晶衍射（HRDCD）方法檢測InGaAs／GaAs超薄應變層量子阱結構參數[J]. 半導體學報(英文版), 1995, 16(3): 170-176.

      • Received Date: 2015-08-19

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