Chin. J. Semicond. > 2007, Volume 28?>?Issue 7?> 1012-1016

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Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer

Tu Xiaoguang, Zhao Lei, Chen Ping, Chen Shaowu, Zuo Yuhua, Yu Jinzhong and Wang Qiming

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Abstract: A polarization-maintaining (PM) fiber Mach-Zehnder (MZ) interferometer has been established to measure the EO effect of very thin film materials with optical anisotropy.Unlike a common MZ interferometer,all the components are connected via polarization-maintaining fibers.At the same time,a polarized DFB laser with a maximum power output of 10mW is adopted as the light source to induce a large extinction ratio.Here,we take it to determine the electro-optical coefficients of a very thin superlattice structure with GaAs,KTP,and GaN as comparative samples.The measured EO coefficients show good comparability with the others.

Key words: electro-optic effect, polarization-maintaining fiber, Mach-Zehnder interferometer

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    Received: 18 August 2015 Revised: 20 March 2007 Online: Published: 01 July 2007

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      Tu Xiaoguang, Zhao Lei, Chen Ping, Chen Shaowu, Zuo Yuhua, Yu Jinzhong, Wang Qiming. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. Journal of Semiconductors, 2007, 28(7): 1012-1016. ****Tu X G, Zhao L, Chen P, Chen S W, Zuo Y H, Yu J Z, Wang Q M. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. Chin. J. Semicond., 2007, 28(7): 1012.
      Citation:
      Tu Xiaoguang, Zhao Lei, Chen Ping, Chen Shaowu, Zuo Yuhua, Yu Jinzhong, Wang Qiming. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. Journal of Semiconductors, 2007, 28(7): 1012-1016. ****
      Tu X G, Zhao L, Chen P, Chen S W, Zuo Y H, Yu J Z, Wang Q M. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. Chin. J. Semicond., 2007, 28(7): 1012.

      Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer

      • State Key Laboratory of Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China

      • State Key Laboratory of Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China

      • State Key Laboratory of Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China

      • State Key Laboratory of Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China

      • State Key Laboratory of Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China

      • State Key Laboratory of Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China

      • State Key Laboratory of Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China

      • Received Date: 2015-08-18
      • Accepted Date: 2007-01-28
      • Revised Date: 2007-03-20
      • Published Date: 2007-07-05

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