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J. Semicond. > 2008, Volume 29?>?Issue 9?> 1827-1831

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Propagation Induced Pulse Broadening of Single Event Transient

Liang Bin, Chen Shuming, Liu Biwei and Liu Zheng

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Abstract: Propagation induced pulse broadening of single event transient is studied by SPICE simulation.It is demonstrated that an unbalanced output load,asymmetric current drive strengths of pull up/pull down networks,and floating body effects are the primary sources for pulse broadening/compression.Grounded on basic formulae of rise/fall propagation delay,the mechanism of pulse broadening/compression is analyzed.We point out definitely for the first time that propagation induced pulse broadening in an SOI inverter chain under a balanced output load is mainly due to floating body effects or local floating body effects.

Key words: circuit simulation, single event transient, pulse broadening

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    Received: 18 August 2015 Revised: 19 May 2008 Online: Published: 01 September 2008

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      Liang Bin, Chen Shuming, Liu Biwei, Liu Zheng. Propagation Induced Pulse Broadening of Single Event Transient[J]. Journal of Semiconductors, 2008, 29(9): 1827-1831. ****Liang B, Chen S M, Liu B W, Liu Z. Propagation Induced Pulse Broadening of Single Event Transient[J]. J. Semicond., 2008, 29(9): 1827.
      Citation:
      Liang Bin, Chen Shuming, Liu Biwei, Liu Zheng. Propagation Induced Pulse Broadening of Single Event Transient[J]. Journal of Semiconductors, 2008, 29(9): 1827-1831. ****
      Liang B, Chen S M, Liu B W, Liu Z. Propagation Induced Pulse Broadening of Single Event Transient[J]. J. Semicond., 2008, 29(9): 1827.

      Propagation Induced Pulse Broadening of Single Event Transient

      • School of Computer,National University of Defense Technology,Changsha 410073,China

      • School of Computer,National University of Defense Technology,Changsha 410073,China

      • School of Computer,National University of Defense Technology,Changsha 410073,China

      • School of Computer,National University of Defense Technology,Changsha 410073,China

      • Received Date: 2015-08-18
      • Accepted Date: 2008-03-17
      • Revised Date: 2008-05-19
      • Published Date: 2008-09-03

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