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J. Semicond. > 2008, Volume 29?>?Issue 9?> 1819-1822

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Coupled SET Pulse Injection in a Circuit Simulator in Ultra-Deep Submicron Technology

Liu Biwei, Chen Shuming, Liang Bin and Liu Zheng

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Abstract: Single event transient (SET) pulse injection with independent current source in a circuit simulator will introduce great error.This paper presents a coupled current source method based on a two-dimensional lookup table for SET pulse injection.This method is implemented in open source SPICE code.Results of this method agree with the device/circuit mix-mode simulation,while the time cost is much smaller.This method is integrated with SPICE and experimental data can be introduced in it.It is appropriate for SET error rate analysis of large scale combinational circuits.

Key words: SETpulse injectionradiation effect

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    Received: 18 August 2015 Revised: 18 March 2008 Online: Published: 01 September 2008

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      Liu Biwei, Chen Shuming, Liang Bin, Liu Zheng. Coupled SET Pulse Injection in a Circuit Simulator in Ultra-Deep Submicron Technology[J]. Journal of Semiconductors, 2008, 29(9): 1819-1822. ****Liu B W, Chen S M, Liang B, Liu Z. Coupled SET Pulse Injection in a Circuit Simulator in Ultra-Deep Submicron Technology[J]. J. Semicond., 2008, 29(9): 1819.
      Citation:
      Liu Biwei, Chen Shuming, Liang Bin, Liu Zheng. Coupled SET Pulse Injection in a Circuit Simulator in Ultra-Deep Submicron Technology[J]. Journal of Semiconductors, 2008, 29(9): 1819-1822. ****
      Liu B W, Chen S M, Liang B, Liu Z. Coupled SET Pulse Injection in a Circuit Simulator in Ultra-Deep Submicron Technology[J]. J. Semicond., 2008, 29(9): 1819.

      Coupled SET Pulse Injection in a Circuit Simulator in Ultra-Deep Submicron Technology

      • Received Date: 2015-08-18
      • Accepted Date: 2008-02-12
      • Revised Date: 2008-03-18
      • Published Date: 2008-09-03

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