Chin. J. Semicond. > 1995, Volume 16?>?Issue 7?> 517-523

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    Received: 19 August 2015 Revised: Online: Published: 01 July 1995

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      程玉華，魏麗瓊，孫玉秀，閻桂珍，李映雪，武國英，王陽元. 薄膜全耗盡SIMOX／SOIMOSFET中單晶體管Latch引起的器件性能蛻變實驗研究[J]. 半導體學報(英文版), 1995, 16(7): 517-523.
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      程玉華，魏麗瓊，孫玉秀，閻桂珍，李映雪，武國英，王陽元. 薄膜全耗盡SIMOX／SOIMOSFET中單晶體管Latch引起的器件性能蛻變實驗研究[J]. 半導體學報(英文版), 1995, 16(7): 517-523.

      • Received Date: 2015-08-19

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