Chin. J. Semicond. > 2007, Volume 28?>?Issue 7?> 1161-1164

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A Testing Method on a Thin Film Transistor Array for Active Matrix Organic Emitting Diode

Liu Xueqiang, Zhang Tong, Wang Lijie, Xia Zhiqiang, Li Mingyou and Liu Shiyong

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Abstract: A novel method is used to evaluate the quality of a TFT array for an active matrix OLED,which can measure the characteristics of TFTs in a 2-T pixel circuit and detect the defects.The proposed testing method is carried out simultaneously with the fabrication processes.Without changing the fabrication processes,only one mask is added to judge the working states of the switch transistor and driving transistor in the pixel circuit.It is a current testing method,which has several advantages including fast response time,high precision,and no damage to the display.

Key words: thin film transistor, organic light emitting diode, active matrix driving, current test, simulation

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    Received: 18 August 2015 Revised: 07 March 2007 Online: Published: 01 July 2007

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      Liu Xueqiang, Zhang Tong, Wang Lijie, Xia Zhiqiang, Li Mingyou, Liu Shiyong. A Testing Method on a Thin Film Transistor Array for Active Matrix Organic Emitting Diode[J]. Journal of Semiconductors, 2007, 28(7): 1161-1164. ****Liu X Q, Zhang T, Wang L J, Xia Z Q, Li M Y, Liu S Y. A Testing Method on a Thin Film Transistor Array for Active Matrix Organic Emitting Diode[J]. Chin. J. Semicond., 2007, 28(7): 1161.
      Citation:
      Liu Xueqiang, Zhang Tong, Wang Lijie, Xia Zhiqiang, Li Mingyou, Liu Shiyong. A Testing Method on a Thin Film Transistor Array for Active Matrix Organic Emitting Diode[J]. Journal of Semiconductors, 2007, 28(7): 1161-1164. ****
      Liu X Q, Zhang T, Wang L J, Xia Z Q, Li M Y, Liu S Y. A Testing Method on a Thin Film Transistor Array for Active Matrix Organic Emitting Diode[J]. Chin. J. Semicond., 2007, 28(7): 1161.

      A Testing Method on a Thin Film Transistor Array for Active Matrix Organic Emitting Diode

      • College of Electronic Science and Engineering,Jilin University,Changchun 130012,China

      • College of Electronic Science and Engineering,Jilin University,Changchun 130012,China

      • College of Electronic Science and Engineering,Jilin University,Changchun 130012,China

      • College of Electronic Science and Engineering,Jilin University,Changchun 130012,China

      • College of Electronic Science and Engineering,Jilin University,Changchun 130012,China

      • College of Electronic Science and Engineering,Jilin University,Changchun 130012,China

      • Received Date: 2015-08-18
      • Accepted Date: 2006-12-15
      • Revised Date: 2007-03-07
      • Published Date: 2007-07-05

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