Chin. J. Semicond. > 1995, Volume 16?>?Issue 1?> 13-18

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    Received: 19 August 2015 Revised: Online: Published: 01 January 1995

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      郝平海，侯曉遠，丁訓民，賀仲卿，蔡衛中，王迅. 用高分辨電子能量損失譜和紫外光電子譜研究多孔硅的電子結構[J]. 半導體學報(英文版), 1995, 16(1): 13-18.
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      郝平海，侯曉遠，丁訓民，賀仲卿，蔡衛中，王迅. 用高分辨電子能量損失譜和紫外光電子譜研究多孔硅的電子結構[J]. 半導體學報(英文版), 1995, 16(1): 13-18.

      • Received Date: 2015-08-19

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